Work

Scan Architecture with Data Observation for Multiple Scan Cell Fault Diagnosis

Year: 2024

Type: conference-paper

Source: International SoC Design Conference

DOI: 10.1109/isocc62682.2024.10762245

Authors: Juyong Lee, Sooryeong Lee, Hayoung Lee, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation

OpenAlex ID: W4404849309

FWCI:

Cites: 5

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Related to: 10