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Identifying Undetectable Defects Using Equivalence Checking

Year: 2024

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/itc51657.2024.00009

Authors: Lars Hedrich, Inga Abel, Jaafar Mejri, Vladimir Zivkovic

Institutions: Goethe University Frankfurt, Infineon Technologies (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404849366

FWCI:

Cites: 12

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Related to: 10