Work

Test mode selection and data I/O by means of a new Scan-based interface

Year: 2024

Type: conference-paper

Source: Conference on Design of Circuits and Integrated Systems

DOI: 10.1109/dcis62603.2024.10769141

Authors: Andrea Floridia, Michelangelo Grosso

Institution: STMicroelectronics (Italy)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404953292

FWCI:

Cites: 10

Cited by:

Related to: 10