Work

Enhanced Diagnosis of Failing Bits in Memory Built-in Self-Test

Year: 2024

Type: conference-paper

Source: IFIP/IEEE International Conference on Very Large Scale Integration

DOI: 10.1109/vlsi-soc62099.2024.10767835

Authors: Ali Shisha, Balajiraja Ravinarayanan, Knut Mellenthin

Institution: Siemens (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404954265

FWCI: 0.322

Cites: 6

Cited by: 1

Related to: 10