An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory
Year: 2024
Type: article
Authors: Hayoung Lee, Juyong Lee, Sungho Kang
Institutions: Ajou University, Yonsei University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G6321057740
OpenAlex ID: W4405021899