Work

Sneak Circuit Analysis Covering Interface Circuits in Spacecraft Integrated Chips while Considering Faults

Year: 2024

Type: conference-paper

Source: International Conference on System Reliability and Safety Engineering (SRSE)

DOI: 10.1109/srse63568.2024.10772492

Authors: Weiming Liu, Cen Chen, Kaiwen Xiao, Mingtao Feng, Haonan Zhang, Guofu Zhai

Institution: Harbin Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405103719

FWCI: 0.634

Cites: 9

Cited by: 2

Related to: 10