Work

An MIV Fault Diagnosis Method Based on Signal Transmission Performance Analysis

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3518554

Authors: Ziwen Xiao, Lifu Du, Zhiming Yang, Cuiyu Liu, Yang Yu

Institutions: Harbin Institute of Technology, China Academy of Launch Vehicle Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: M3D集成电路层间通孔的测试与故障诊断技术研究

OpenAlex ID: W4405844577

FWCI: 0.641

Cites: 25

Cited by: 2

Related to: 10