Work

Built-In Self-Repair of Small Delay Faults Occurring to TSVs in a 3D-DRAM Using an Enhanced Pulse-Vanishing Test

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3514732

Authors: Chen-Yu Huang, Shi-Yu Huang

Institution: National Tsing Hua University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Semiconductor Research Corporation, National Science and Technology Council

Award: G7350258107

OpenAlex ID: W4405844784

FWCI: 1.603

Cites: 25

Cited by: 5

Related to: 10