Work

The Intermittent Fault Diagnosis of Analog Circuits Based on EMD-CrossFormer

Year: 2024

Type: conference-paper

Source: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

DOI: 10.1109/apccas62602.2024.10808449

Authors: Chenyi Zhu, Quan Yin, Jigui Miao, Jindian Chen

Institution: Huazhong University of Science and Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405846303

FWCI: 0.932

Cites: 10

Cited by: 3

Related to: 10