Work

Connectivity-Agnostic Built-In Self-Repair of Interconnects in a Chiplet IC

Year: 2024

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2024.3524473

Authors: Chi Lai, Shi-Yu Huang

Institution: National Tsing Hua University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Japan Science and Technology Corporation, National Science and Technology Council

Award: G7350258107

OpenAlex ID: W4405934642

FWCI:

Cites: 21

Cited by:

Related to: 10