Work

Multi-Objective Test Case Generation and Prioritization using Generative AI for ASIC Verification

Year: 2024

Type: conference-paper

DOI: 10.1109/csitss64042.2024.10817057

Authors: Hemachandra Ramanath Bhat, Manesha P, Ankur Kumar Muduli, Suresh N, Sudhakar K N, Phani Kumar Pullela

Institution: RV University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405975600

FWCI: 0.318

Cites: 18

Cited by: 1

Related to: 10