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A study on chip delay measurement sensor based on scan chain

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.2907

Authors: Peixin Liu, Xiao Hu, Xinjie Yi

Institution: National University of Defense Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406182339

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