Work

Analog circuit fault diagnosis method using auto-encoder based feature extraction

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.2824

Authors: Naixin Zhou, Shibo Chen, Jiaming Zhao, Yijiu Zhao

Institution: University of Electronic Science and Technology of China

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406182782

FWCI: 0.928

Cites:

Cited by: 1

Related to: 10