An efficient scandump methodology to left shift DFT testing into Gate-level Verification
Year: 2024
Type: conference-paper
Authors: Kavya R, S Shrinidhi Rao, Sanjoy Saha, Alok Kumar, Garima Srivastava, Seonil Brain Choi
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406354982