Work

Research on the Application of Artificial Intelligence Technology in Microelectronics Testing and Fault Diagnosis

Year: 2024

Type: conference-paper

Source: International Conference on Data Analytics, Computing and Artificial Intelligence (ICDACAI)

DOI: 10.1109/icdacai65086.2024.00070

Authors: Yiqun Zhang, Hailin Liu, Feng Xu

Institution: Weifang Engineering Vocational College

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406460328

FWCI: 0.322

Cites: 12

Cited by: 1

Related to: 10