Work

Output Current Built-In Self-Test Scheme in Automotive High Density uLED Matrix Driver

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Electronics, Circuits and Systems (ICECS)

DOI: 10.1109/icecs61496.2024.10848978

Authors: P. Lorenzi, M. Montoncelli, A. De Cicco, R. Chiodo, P. Vallese, A. Scenini, L. Masala

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406895192

FWCI: 0.322

Cites:

Cited by: 1

Related to: 10