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Efficient Built-In Self-Test Strategy for Neuromorphic Hardware Based On Alarm Placement

Year: 2024

Type: conference-paper

Source: IEEE Pacific Rim International Symposium on Dependable Computing (PRDC)

DOI: 10.1109/prdc63035.2024.00014

Authors: Ilknur Mustafazade, Anup Das, Nagarajan Kandasamy

Institution: Drexel University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4407129618

FWCI: 0.312

Cites: 33

Cited by: 1

Related to: 10