Work

A Study on Functional Coverage-Driven Random Stimulus Generation Methods for Integrated Circuit Functional Verification

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Data Science and Computer Application (ICDSCA)

DOI: 10.1109/icdsca63855.2024.10859372

Author: Yang Lang

Institution: Fiberhome Technology Group (China)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407215226

FWCI:

Cites: 9

Cited by:

Related to: 10