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A Machine Learning Based Approach for Post Manufacturing Performance Sensing in Analog Circuits

Year: 2024

Type: conference-paper

Source: International Conference on Artificial Intelligence and Signal Processing (AISP)

DOI: 10.1109/aisp61711.2024.10870736

Authors: Jayanta Kumar Panigrahi, Debiprasad Priyabrata Acharya, Umakanta Nanda

Institutions: National Institute of Technology Rourkela, VIT-AP University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407404780

FWCI:

Cites: 11

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Related to: 10