Work

Design of Power-Efficient Built-In Self-Repair for Interleaved Memory Systems

Year: 2024

Type: conference-paper

Source: IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

DOI: 10.1109/edkcon62339.2024.10870808

Authors: Sowvik Dey, Amiya Karmakar

Institution: Maulana Abul Kalam Azad University of Technology, West Bengal

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407467368

FWCI:

Cites: 15

Cited by:

Related to: 10