Work

Research on Integrated Circuit Fault Detection Based on Improved Particle Swarm Optimization (SNA)

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)

DOI: 10.1109/auteee62881.2024.10869799

Authors: Xuefeng Bai, Yipeng Zhang

Institution: North China University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407475692

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Cites: 9

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Related to: 10