Work

An Approach for Increasing Memory Repair Efficiency

Year: 2024

Type: conference-paper

DOI: 10.1109/ewdts63723.2024.10873706

Authors: K. Amirkhanyan, A. Babayan, S. Shoukourian, V. Vardanian, Y. Zorian

Institution: Synopsys (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407691945

FWCI: 0.311

Cites: 13

Cited by: 1

Related to: 10