Work

Advanced Path Delay Fault Testing Strategies in High-Performance Digital Circuits

Year: 2024

Type: conference-paper

DOI: 10.1109/ewdts63723.2024.10873667

Authors: Palanichamy Manikandan, Ramesh Patel, Sundar Gopalakrishnan, Karthikeyan Palaniswamy

Institution: PSG College of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407693067

FWCI:

Cites: 36

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Related to: 10