Work

Multistage Enhanced Diagnosis With Fault Candidate Reduction

Year: 2025

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2025.3549352

Authors: Hyojun Yun, Hyeonchan Lim, Hayoung Lee, Sungho Kang

Institutions: Yonsei University, Ajou University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Trade, Industry and Energy

Award: G5796395378

OpenAlex ID: W4408223248

FWCI:

Cites: 7

Cited by:

Related to: 10