Work

Chip Aging and Transition Faults With High Switching Activities Under Scan-Based Tests

Year: 2025

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3545288

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

Award: G4832518151

OpenAlex ID: W4408304986

FWCI:

Cites: 21

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Related to: 10