Work

High performance advanced fault model diagnosis

Year: 2024

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats64447.2024.10915398

Authors: Vaibhav Mishra, Bharath Nandakumar, Sameer Chillarige

Institution: Cadence Design Systems (India)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408442170

FWCI:

Cites: 18

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Related to: 10