Work

Post-silicon Trace Signal Selection Using Genetic Algorithm

Year: 2024

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats64447.2024.10915396

Authors: Hanxu Feng, Yuanhang Bu, Jing Zhou, Shuo Wang, Zhuoli Wang, Lei Chen

Institution: Beijing Microelectronics Technology Institute

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408442202

FWCI:

Cites: 11

Cited by:

Related to: 10