Work

Optimized Detection of Marginal Defects in Standard Cells Using Unsupervised Learning

Year: 2024

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats64447.2024.10915423

Authors: Karthik Pandaram, Hussam Amrouch, Ilia Polian

Institution: University of Stuttgart

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408442418

FWCI:

Cites: 22

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Related to: 10