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A Testability Improvement Method of Combinational Circuits Based on the SDC Conditions

Year: 2024

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats64447.2024.10915501

Authors: Yang Zeng, Xiaole Cui

Institution: Peking University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408443117

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Cites: 17

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Related to: 10