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MEMFD: A Multi-EDT Multi-Fault Scan Chain Diagnosis Methodology with Deep Learning

Year: 2024

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats64447.2024.10915334

Authors: Saman Aijaz Siddiqui, Uzair Ruhulamin Patel, Utsav Jana, Binod Kumar

Institutions: Indian Institute of Technology Jodhpur, Singapore University of Technology and Design

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408443548

FWCI: 0.322

Cites: 23

Cited by: 1

Related to: 10