Work

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning

Year: 2025

Type: article

Source: IEEE Design and Test

DOI: 10.1109/mdat.2025.3551949

Authors: Állan F. G. Ferreira, Lucas B. Zilch, Marcelo S. Lubaszewski, Tiago R. Balen

Institution: Universidade Federal do Rio Grande do Sul

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Coordenação de Aperfeiçoamento de Pessoal de Nível Superior, Conselho Nacional de Desenvolvimento Científico e Tecnológico, Fundação de Amparo à Pesquisa do Estado do Rio Grande do Sul

OpenAlex ID: W4408520463

FWCI: 1.458

Cites: 12

Cited by: 2

Related to: 10