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A Vacuum Ultraviolet Light Source for Photoelectron Yield Spectroscopy Testing

Year: 2024

Type: conference-paper

Source: International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)

DOI: 10.1109/icsmd64214.2024.10920544

Authors: Yiming Wang, Yu Huang, Xiaoxu Wang, Zhanfeng Li, Yu Chen, Shuang Wang

Institutions: Chinese Academy of Sciences, Changchun Institute of Optics, Fine Mechanics and Physics, University of Chinese Academy of Sciences, Xi'an Jiaotong University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408701053

FWCI:

Cites: 3

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Related to: 10