Work

Using pulsed-latch scan chains for non-destructive ASIC testing

Year: 2024

Type: conference-paper

Source: IEEE Central America and Panama Convention (CONCAPAN)

DOI: 10.1109/concapan63470.2024.10933830

Authors: Bernardo Rodriguez-Hall, Alfonso Chacόn-Rodríguez, Renato Rimolo-Donadio, Ronny García-Ramírez

Institution: Instituto Tecnológico de Costa Rica

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408861300

FWCI:

Cites: 9

Cited by:

Related to: 10