Work

Integrated Circuit Fault Diagnosis Model Based on Multilayer Perceptron

Year: 2024

Type: conference-paper

Source: International Conference on Electronic Information Engineering and Computer Communication (EIECC)

DOI: 10.1109/eiecc64539.2024.10929480

Authors: Yihui Mu, Keling Chen, Fuyi Yang, Jiaxin Tan, Liuchuan Yang

Institution: Chengdu College of University of Electronic Science And Technology of China

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408888213

FWCI:

Cites: 10

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Related to: 10