Work

Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963947

Authors: Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre

Institutions: Politecnico di Torino, STMicroelectronics (Italy)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409536569

FWCI: 0.928

Cites: 15

Cited by: 1

Related to: 10