Work

A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963957

Authors: T. S. Copetti, S. Chakraborty, L. M. Bolzani Poehls

Institutions: RWTH Aachen University, Leibniz Institute for High Performance Microelectronics

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409536681

FWCI: 0.928

Cites: 19

Cited by: 1

Related to: 10