Work

Investigating Manufacturing Defects Leading to Potential Silent Data Errors

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963969

Authors: Jorge Lopez, Victor Champac

Institution: National Institute of Astrophysics, Optics and Electronics

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409536703

FWCI: 0.928

Cites: 14

Cited by: 1

Related to: 10