Work

On-Chip Aging Sensor Core for Silicon Lifecycle Management

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963953

Authors: Fabian Vargas, Aneesh Balakrishnan

Institution: Leibniz Institute for High Performance Microelectronics

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409561190

FWCI: 5.553

Cites: 15

Cited by: 6

Related to: 10