Work

Case Study: UVM-FIE: Enhancing UVM-Based Fault Injection Library for Complex Designs

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963962

Authors: Leonardo S. Tavares, Wang J. Chau, Fernando J. Fonseca

Institution: Universidade de São Paulo

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4409561204

FWCI: 1.856

Cites: 5

Cited by: 2

Related to: 10