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About the Functional In-Field Self-Testing of AI Accelerators

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963960

Authors: Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Robert Limas Sierra, Matteo Sonza Reorda

Institution: Politecnico di Torino

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409561237

FWCI:

Cites: 23

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Related to: 10