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Large Language Models for Printed Circuit Board Test Generation

Year: 2025

Type: conference-paper

Source: IEEE Latin American Test Symposium (LATS)

DOI: 10.1109/lats65346.2025.10963941

Authors: Albin Lidbäck, Erik Larsson

Institution: Lund University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4409561500

FWCI:

Cites: 1

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Related to: 10