Work

Reinforcement-Learning-Based Test Point Insertion for Power-Safe Testing in Monolithic 3-D ICs

Year: 2025

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2025.3562950

Authors: Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty

Institutions: Nvidia (United States), Arizona State University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Science Foundation

Award: SHF: Small: Testing and Design-for-Test Techniques for Monolithic 3D Integrated Circuits

OpenAlex ID: W4409640886

FWCI:

Cites: 27

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Related to: 10