Work

An XGBoost-Based Method for Predicting the Location of MIV Open Fault

Year: 2025

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3530526

Authors: Yuling Shang, Longlu Geng, Chunquan Li, Zhuofan Song, Jintao Zhang, Junji Li

Institution: Guilin University of Electronic Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G4616628276

OpenAlex ID: W4410027692

FWCI: 0.732

Cites: 36

Cited by: 1

Related to: 10