Work

Hazard-Based Functionally Possible Transition Faults With High Functional Switching Activities

Year: 2025

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2025.3567550

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

Award: G4832518151

OpenAlex ID: W4410115257

FWCI:

Cites: 30

Cited by:

Related to: 10