Work

Ultra-low-voltage observation of battery materials by scanning electron microscopy

Year: 2025

Type: article

Source: Microscopy

DOI: 10.1093/jmicro/dfaf024

Authors: Yoichiro Hashimoto, Yutaka Nagaoka, Toru Aiso, Shuhei Yabu, Masahiro Sasajima

Institutions: Hitachi High-Tech (Japan), Hitachi (Japan)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410427786

FWCI: 0.41

Cites: 9

Cited by: 2

Related to: 10