Resistive Defect Analysis and Fault Modeling of DICE Memory in Commercial 40-nm CMOS Technology
Year: 2025
Type: article
Authors: Yi Wang, Jiahao Yin, Yaohua Xu, Chunmei Hu
Institutions: Anhui University, National University of Defense Technology
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4410738826