Work

Single and Multiple Fault Detection in Analog Circuits Using V-Transform Coefficients

Year: 2025

Type: conference-paper

Source: Devices for Integrated Circuit (DevIC)

DOI: 10.1109/devic63749.2025.11012469

Authors: Anshul Mahawar, Anjali Rai, Swati Sinha, Rahul Bhattacharya

Institutions: Indian Institute of Technology Dhanbad, University of Engineering & Management

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410855118

FWCI:

Cites: 28

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Related to: 10