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Automatically Monitor and Process V93K Pattern for Large Scale High-speed Digital Devices on ADVANTEST ATE platform

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017850

Authors: Qingqing Xia, Yefang Wang

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410987124

FWCI: 0.928

Cites: 4

Cited by: 1

Related to: 10