Work

FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017873

Authors: David Keezer, Cao Wang

Institution: Eastern Institute of Technology, Ningbo

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4410987804

FWCI: 2.785

Cites: 1

Cited by: 3

Related to: 10