Work

Development of a Non-Contact Ground Noise Injector on Flexible PCB for RF Immunity Test of a Mobile Phone

Year: 2025

Type: article

Source: IEEE Transactions on Electromagnetic Compatibility

DOI: 10.1109/temc.2025.3572606

Authors: Hyunjae Lee, Junhee Han, Gyeong-Ryun Choi, Seyoon Cheon, Hwan-Woo Shim, Hyun Ho Park, Wansoo Nah

Institutions: Sungkyunkwan University, Samsung (South Korea), Samsung Electronics (South Korea), University of Suwon

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Research Foundation of Korea

OpenAlex ID: W4411143987

FWCI:

Cites: 10

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Related to: 10